ESREF 2027

Technical Program Chairs
Technical Program Chairs
- François MARC - IMS, University of Bordeaux, France
- Alexandrine GRACIA - IMS, University of Bordeaux, France
- Nathalie LABAT - IMS, University of Bordeaux, France
- Nicolas NOLHIER - LAAS-CNRS, University of Toulouse, France
- Loïc THEOLIER - IMS, University of Bordeaux, France
Sub-committee Chairs
- Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
  TBD
- Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
  TBD
- Topic C: Progress in Failure Analysis: Defect Detection and Analysis
  TBD
- Topic D: Reliability of Microwave devices and circuits
  TBD
- Topic E: Packaging and Assembly : Reliability and Failure Analysis
  TBD
- Topic F : Power Devices and Microelectronic System: Reliability and Failure Analysis
  - (Smart-Power Devices, Silicon Power Devices, Wide-Bandgap Devices, Power Electronic System)
    TBD
- Topic G: Photonics Reliability
  TBD
- Topic H: MEMS and sensors Reliability
  TBD
- Topic I : Extreme environments
  - Topic I1: ESD and EMC
    TBD
  - Topic I2: Radiation
    TBD